Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation

Euan Ramsay; Dong Xiao; Derryck T. Reid; Bernd Offenbeck; Jan Sundermeyer; Kay Seemann; Norbert Weber

Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation

Euan Ramsay, Dong Xiao, Derryck T. Reid, Bernd Offenbeck, Jan Sundermeyer, Kay Seemann, Norbert Weber

School of Engineering & Physical Sciences

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

We report the use of electric-field-induced second harmonic generation to investigate the electrical signal in a CMOS chip with 2.3µm femtosecond pulses. A linear relationship between the signal and electric field is found. © 2005 Optical Society of America.

Original language	English
Title of host publication	2005 Quantum Electronics and Laser Science Conference (QELS)
Pages	818-820
Number of pages	3
Volume	2
Publication status	Published - 2005
Event	2005 Quantum Electronics and Laser Science Conference - Baltimore, MD, United States Duration: 22 May 2005 → 27 May 2005

Conference

Conference	2005 Quantum Electronics and Laser Science Conference
Abbreviated title	QELS
Country/Territory	United States
City	Baltimore, MD
Period	22/05/05 → 27/05/05

Cite this

@inproceedings{f385d96ca1344b57be95580c9060b959,

title = "Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation",

abstract = "We report the use of electric-field-induced second harmonic generation to investigate the electrical signal in a CMOS chip with 2.3µm femtosecond pulses. A linear relationship between the signal and electric field is found. {\textcopyright} 2005 Optical Society of America.",

author = "Euan Ramsay and Dong Xiao and Reid, \{Derryck T.\} and Bernd Offenbeck and Jan Sundermeyer and Kay Seemann and Norbert Weber",

year = "2005",

language = "English",

isbn = "1557527962",

volume = "2",

pages = "818--820",

booktitle = "2005 Quantum Electronics and Laser Science Conference (QELS)",

note = "2005 Quantum Electronics and Laser Science Conference, QELS ; Conference date: 22-05-2005 Through 27-05-2005",

}

Ramsay, E, Xiao, D, Reid, DT, Offenbeck, B, Sundermeyer, J, Seemann, K & Weber, N 2005, Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation. in 2005 Quantum Electronics and Laser Science Conference (QELS). vol. 2, pp. 818-820, 2005 Quantum Electronics and Laser Science Conference, Baltimore, MD, United States, 22/05/05.

TY - GEN

T1 - Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation

AU - Ramsay, Euan

AU - Xiao, Dong

AU - Reid, Derryck T.

AU - Offenbeck, Bernd

AU - Sundermeyer, Jan

AU - Seemann, Kay

AU - Weber, Norbert

PY - 2005

Y1 - 2005

N2 - We report the use of electric-field-induced second harmonic generation to investigate the electrical signal in a CMOS chip with 2.3µm femtosecond pulses. A linear relationship between the signal and electric field is found. © 2005 Optical Society of America.

AB - We report the use of electric-field-induced second harmonic generation to investigate the electrical signal in a CMOS chip with 2.3µm femtosecond pulses. A linear relationship between the signal and electric field is found. © 2005 Optical Society of America.

UR - https://www.scopus.com/pages/publications/27144526735

M3 - Conference contribution

SN - 1557527962

VL - 2

SP - 818

EP - 820

BT - 2005 Quantum Electronics and Laser Science Conference (QELS)

T2 - 2005 Quantum Electronics and Laser Science Conference

Y2 - 22 May 2005 through 27 May 2005

ER -

Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation

Abstract

Conference

Other files and links

Fingerprint

Cite this