Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation

Euan Ramsay, Dong Xiao, Derryck T. Reid, Bernd Offenbeck, Jan Sundermeyer, Kay Seemann, Norbert Weber

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

We report the use of electric-field-induced second harmonic generation to investigate the electrical signal in a CMOS chip with 2.3µm femtosecond pulses. A linear relationship between the signal and electric field is found. © 2005 Optical Society of America.

Original languageEnglish
Title of host publication2005 Quantum Electronics and Laser Science Conference (QELS)
Pages818-820
Number of pages3
Volume2
Publication statusPublished - 2005
Event2005 Quantum Electronics and Laser Science Conference - Baltimore, MD, United States
Duration: 22 May 200527 May 2005

Conference

Conference2005 Quantum Electronics and Laser Science Conference
Abbreviated titleQELS
CountryUnited States
CityBaltimore, MD
Period22/05/0527/05/05

Fingerprint Dive into the research topics of 'Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation'. Together they form a unique fingerprint.

Cite this