Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation

Dong Xiao; Euan Ramsay; Bernd Offenbeck; Norbert Weber; Derryck T. Reid

doi:10.1117/12.645640

Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation

Dong Xiao
, Euan Ramsay
, Bernd Offenbeck
, Norbert Weber
, Derryck T. Reid

School of Engineering & Physical Sciences

Research output: Contribution to journal › Article › peer-review

Abstract

We report the use of electric field induced second harmonic generation to probe electrical signals in a CMOS chip. The second harmonic of incident 2.3 µm illumination provided by a femtosecond optical parametric oscillator was measured and shown to .depend quadratically on both optical intensity and on the applied DC electric field. By using a near infrared photomultiplier tube it was possible to monitor directly the electrical waveform in the chip on the oscilloscope.

Original language	English
Article number	61080H
Journal	Proceedings of SPIE
Volume	6108
DOIs	https://doi.org/10.1117/12.645640
Publication status	Published - 2006
Event	Commercial and Biomedical Applications of Ultrafast Lasers VI - San Jose, CA, United States Duration: 17 Jan 2006 → 19 Jan 2006

Keywords

EFISH
Flip-chip
Nonlinear imaging

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10.1117/12.645640

Cite this

@article{4b4b60318694495188c2c028999e6e90,

title = "Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation",

abstract = "We report the use of electric field induced second harmonic generation to probe electrical signals in a CMOS chip. The second harmonic of incident 2.3 µm illumination provided by a femtosecond optical parametric oscillator was measured and shown to .depend quadratically on both optical intensity and on the applied DC electric field. By using a near infrared photomultiplier tube it was possible to monitor directly the electrical waveform in the chip on the oscilloscope.",

keywords = "EFISH, Flip-chip, Nonlinear imaging",

author = "Dong Xiao and Euan Ramsay and Bernd Offenbeck and Norbert Weber and Reid, \{Derryck T.\}",

year = "2006",

doi = "10.1117/12.645640",

language = "English",

volume = "6108",

journal = "Proceedings of SPIE",

issn = "1996-756X",

publisher = "SPIE",

note = "Commercial and Biomedical Applications of Ultrafast Lasers VI ; Conference date: 17-01-2006 Through 19-01-2006",

}

TY - JOUR

T1 - Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation

AU - Xiao, Dong

AU - Ramsay, Euan

AU - Offenbeck, Bernd

AU - Weber, Norbert

AU - Reid, Derryck T.

PY - 2006

Y1 - 2006

N2 - We report the use of electric field induced second harmonic generation to probe electrical signals in a CMOS chip. The second harmonic of incident 2.3 µm illumination provided by a femtosecond optical parametric oscillator was measured and shown to .depend quadratically on both optical intensity and on the applied DC electric field. By using a near infrared photomultiplier tube it was possible to monitor directly the electrical waveform in the chip on the oscilloscope.

AB - We report the use of electric field induced second harmonic generation to probe electrical signals in a CMOS chip. The second harmonic of incident 2.3 µm illumination provided by a femtosecond optical parametric oscillator was measured and shown to .depend quadratically on both optical intensity and on the applied DC electric field. By using a near infrared photomultiplier tube it was possible to monitor directly the electrical waveform in the chip on the oscilloscope.

KW - EFISH

KW - Flip-chip

KW - Nonlinear imaging

UR - https://www.scopus.com/pages/publications/33645973246

U2 - 10.1117/12.645640

DO - 10.1117/12.645640

M3 - Article

SN - 1996-756X

VL - 6108

JO - Proceedings of SPIE

JF - Proceedings of SPIE

M1 - 61080H

T2 - Commercial and Biomedical Applications of Ultrafast Lasers VI

Y2 - 17 January 2006 through 19 January 2006

ER -

Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation

Abstract

Keywords

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