We report the use of electric field induced second harmonic generation to probe electrical signals in a CMOS chip. The second harmonic of incident 2.3 µm illumination provided by a femtosecond optical parametric oscillator was measured and shown to .depend quadratically on both optical intensity and on the applied DC electric field. By using a near infrared photomultiplier tube it was possible to monitor directly the electrical waveform in the chip on the oscilloscope.
|Journal||Proceedings of SPIE - the International Society for Optical Engineering|
|Publication status||Published - 2006|
|Event||Commercial and Biomedical Applications of Ultrafast Lasers VI - San Jose, CA, United States|
Duration: 17 Jan 2006 → 19 Jan 2006
- Nonlinear imaging