Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation

Xiao Dong; Euan Ramsay; Derryck T. Reid; Bernd Offenbeck; Jan Sundermeyer; Kay Seemann; Norbert Weber

doi:10.1109/CLEOE.2005.1568025

Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation

Xiao Dong, Euan Ramsay, Derryck T. Reid, Bernd Offenbeck, Jan Sundermeyer, Kay Seemann, Norbert Weber

School of Engineering & Physical Sciences

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We report the use of electric-field-induced second-harmonic generation to investigate the electrical signal in CMOS chips with 2.3 µm femtosecond pulses. A linear relationship between the signal and applied voltage is found for voltages < IV. © 2005 IEEE.

Original language	English
Title of host publication	2005 Conference on Lasers and Electro-Optics Europe
DOIs	https://doi.org/10.1109/CLEOE.2005.1568025
Publication status	Published - 2005
Event	2005 Conference on Lasers and Elctro-Optics Europe - Munich, Germany Duration: 12 Jun 2005 → 17 Jun 2005

Conference

Conference	2005 Conference on Lasers and Elctro-Optics Europe
Country/Territory	Germany
City	Munich
Period	12/06/05 → 17/06/05

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10.1109/CLEOE.2005.1568025

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@inproceedings{e06c4caa4ab84c78a09f260b2282ba47,

title = "Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation",

abstract = "We report the use of electric-field-induced second-harmonic generation to investigate the electrical signal in CMOS chips with 2.3 µm femtosecond pulses. A linear relationship between the signal and applied voltage is found for voltages < IV. {\textcopyright} 2005 IEEE.",

author = "Xiao Dong and Euan Ramsay and Reid, {Derryck T.} and Bernd Offenbeck and Jan Sundermeyer and Kay Seemann and Norbert Weber",

year = "2005",

doi = "10.1109/CLEOE.2005.1568025",

language = "English",

isbn = "0780389743",

booktitle = "2005 Conference on Lasers and Electro-Optics Europe",

note = "2005 Conference on Lasers and Elctro-Optics Europe ; Conference date: 12-06-2005 Through 17-06-2005",

}

Dong, X, Ramsay, E, Reid, DT, Offenbeck, B, Sundermeyer, J, Seemann, K & Weber, N 2005, Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation. in 2005 Conference on Lasers and Electro-Optics Europe. 2005 Conference on Lasers and Elctro-Optics Europe, Munich, Germany, 12/06/05. https://doi.org/10.1109/CLEOE.2005.1568025

TY - GEN

T1 - Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation

AU - Dong, Xiao

AU - Ramsay, Euan

AU - Reid, Derryck T.

AU - Offenbeck, Bernd

AU - Sundermeyer, Jan

AU - Seemann, Kay

AU - Weber, Norbert

PY - 2005

Y1 - 2005

N2 - We report the use of electric-field-induced second-harmonic generation to investigate the electrical signal in CMOS chips with 2.3 µm femtosecond pulses. A linear relationship between the signal and applied voltage is found for voltages < IV. © 2005 IEEE.

AB - We report the use of electric-field-induced second-harmonic generation to investigate the electrical signal in CMOS chips with 2.3 µm femtosecond pulses. A linear relationship between the signal and applied voltage is found for voltages < IV. © 2005 IEEE.

UR - http://www.scopus.com/inward/record.url?scp=42749103986&partnerID=8YFLogxK

U2 - 10.1109/CLEOE.2005.1568025

DO - 10.1109/CLEOE.2005.1568025

M3 - Conference contribution

SN - 0780389743

SN - 9780780389748

BT - 2005 Conference on Lasers and Electro-Optics Europe

T2 - 2005 Conference on Lasers and Elctro-Optics Europe

Y2 - 12 June 2005 through 17 June 2005

ER -

Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation

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