Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation

Xiao Dong, Euan Ramsay, Derryck T. Reid, Bernd Offenbeck, Jan Sundermeyer, Kay Seemann, Norbert Weber

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We report the use of electric-field-induced second-harmonic generation to investigate the electrical signal in CMOS chips with 2.3 µm femtosecond pulses. A linear relationship between the signal and applied voltage is found for voltages < IV. © 2005 IEEE.

Original languageEnglish
Title of host publication2005 Conference on Lasers and Electro-Optics Europe
DOIs
Publication statusPublished - 2005
Event2005 Conference on Lasers and Elctro-Optics Europe - Munich, Germany
Duration: 12 Jun 200517 Jun 2005

Conference

Conference2005 Conference on Lasers and Elctro-Optics Europe
CountryGermany
CityMunich
Period12/06/0517/06/05

Fingerprint Dive into the research topics of 'Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation'. Together they form a unique fingerprint.

Cite this