Abstract
A powerful technique for studying the excitation dynamics of thin-film condensed matter is demonstrated. The field-enhancement within a Fabry-Pérot etalon, and the sensitivity of such a structure to the optical coefficients of the spacer layer material, is combined with the time and spectral resolution afforded by use of time-delayed picosecond-continuum monitoring. Applied to ZnSe interference-filter material the optoelectronic refractive nonlinearity is identified, however rapid lattice heating is observed leading to dominance of the optothermal nonlinearity (of opposite sign) within 3 ps after photoexcitation. © 1994.
| Original language | English |
|---|---|
| Pages (from-to) | 111-115 |
| Number of pages | 5 |
| Journal | Optics Communications |
| Volume | 111 |
| Issue number | 1-2 |
| Publication status | Published - 15 Sept 1994 |