Physical degradation of a-Si films on thermal treatment: a scanning electron microscope study

P. John, Ibrahim M Odeh, M. J K Thomas, Michael J Tricker, J. I B Wilson, R. S. Dhariwal

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Physical degradation of a-Si films on thermal treatment: a scanning electron microscope study'. Together they form a unique fingerprint.

Physics & Astronomy