Performance Comparison of the Run Sum t , EWMA t and Standard t Control Charts

Michael Boon Chong Khoo, Wai Chung Yeong, Jia Yu Choong, Wei Lin Teoh, Sin Yin Teh

Research output: Contribution to conferencePaper

Abstract

—The t-chart is a rare event chart, where a rare event chart is a control chart that provides information about a process when the data comes from rarely occurring events. In this paper, a comparison of the performances of several t type control charts, like the run sum t chart, exponentially weighted moving average (EWMA) t chart and standard t chart are compared based on the average run length (ARL) criterion. The results show that among the t type charts considered, the run sum t chart gives smaller ARL values and is more sensitive than the EWMA t chart for detecting medium to large shifts in the process mean. The EWMA t chart is more sensitive than the run sum t chart for detecting small mean shifts. However, the standard t chart has the largest ARL compared with the run sum t chart and the EWMA t chart.
Original languageEnglish
Pages1-4
Number of pages4
DOIs
Publication statusPublished - 2016
Event2016 International Congress on Recent Development in Engineering and Technology - Kuala Lumpur, Malaysia
Duration: 22 Aug 201624 Aug 2016

Conference

Conference2016 International Congress on Recent Development in Engineering and Technology
Abbreviated titleRDET-16
CountryMalaysia
CityKuala Lumpur
Period22/08/1624/08/16

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    Khoo, M. B. C., Yeong, W. C., Choong, J. Y., Teoh, W. L., & Teh, S. Y. (2016). Performance Comparison of the Run Sum t , EWMA t and Standard t Control Charts. 1-4. Paper presented at 2016 International Congress on Recent Development in Engineering and Technology, Kuala Lumpur, Malaysia. https://doi.org/10.17758/EAP.EAP816