Abstract
—The t-chart is a rare event chart, where a rare event chart is a control chart that provides information about a process when the data comes from rarely occurring events. In this paper, a comparison of the performances of several t type control charts, like the run sum t chart, exponentially weighted moving average (EWMA) t chart and standard t chart are compared based on the average run length (ARL) criterion. The results show that among the t type charts considered, the run sum t chart gives smaller ARL values and is more sensitive than the EWMA t chart for detecting medium to large shifts in the process mean. The EWMA t chart is more sensitive than the run sum t chart for detecting small mean shifts. However, the standard t chart has the largest ARL compared with the run sum t chart and the EWMA t chart.
Original language | English |
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Pages | 1-4 |
Number of pages | 4 |
DOIs | |
Publication status | Published - 2016 |
Event | 2016 International Congress on Recent Development in Engineering and Technology - Kuala Lumpur, Malaysia Duration: 22 Aug 2016 → 24 Aug 2016 |
Conference
Conference | 2016 International Congress on Recent Development in Engineering and Technology |
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Abbreviated title | RDET-16 |
Country/Territory | Malaysia |
City | Kuala Lumpur |
Period | 22/08/16 → 24/08/16 |