Patterns - a novel approach to representing product engineering knowledge

R G Dewar, James Millar Ritchie, Ian Black

Research output: Contribution to conferencePaper

Original languageEnglish
Pages351-355
Number of pages5
Publication statusPublished - 1999
Event'Advances in Manufacturing Technology', 15th National Conference on Manufacturing Research - Bath, United Kingdom
Duration: 6 Sep 19998 Sep 1999

Conference

Conference'Advances in Manufacturing Technology', 15th National Conference on Manufacturing Research
CountryUnited Kingdom
CityBath
Period6/09/998/09/99

Cite this

Dewar, R. G., Ritchie, J. M., & Black, I. (1999). Patterns - a novel approach to representing product engineering knowledge. 351-355. Paper presented at 'Advances in Manufacturing Technology', 15th National Conference on Manufacturing Research, Bath, United Kingdom.
Dewar, R G ; Ritchie, James Millar ; Black, Ian. / Patterns - a novel approach to representing product engineering knowledge. Paper presented at 'Advances in Manufacturing Technology', 15th National Conference on Manufacturing Research, Bath, United Kingdom.5 p.
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author = "Dewar, {R G} and Ritchie, {James Millar} and Ian Black",
year = "1999",
language = "English",
pages = "351--355",
note = "'Advances in Manufacturing Technology', 15th National Conference on Manufacturing Research ; Conference date: 06-09-1999 Through 08-09-1999",

}

Dewar, RG, Ritchie, JM & Black, I 1999, 'Patterns - a novel approach to representing product engineering knowledge' Paper presented at 'Advances in Manufacturing Technology', 15th National Conference on Manufacturing Research, Bath, United Kingdom, 6/09/99 - 8/09/99, pp. 351-355.

Patterns - a novel approach to representing product engineering knowledge. / Dewar, R G; Ritchie, James Millar; Black, Ian.

1999. 351-355 Paper presented at 'Advances in Manufacturing Technology', 15th National Conference on Manufacturing Research, Bath, United Kingdom.

Research output: Contribution to conferencePaper

TY - CONF

T1 - Patterns - a novel approach to representing product engineering knowledge

AU - Dewar, R G

AU - Ritchie, James Millar

AU - Black, Ian

PY - 1999

Y1 - 1999

M3 - Paper

SP - 351

EP - 355

ER -

Dewar RG, Ritchie JM, Black I. Patterns - a novel approach to representing product engineering knowledge. 1999. Paper presented at 'Advances in Manufacturing Technology', 15th National Conference on Manufacturing Research, Bath, United Kingdom.