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Overlayer stress effects on defect formation in Si and Ge
Nick E. B. Cowern*, Nick S Bennett, Chihak Ahn, Joo Chul Yoon, Silke Hamm, Wilfried Lerch, Hamid Kheyrandish, Filadelfo Cristiano, Ardechir Pakfar
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
3
Citations
(Scopus)