Optical thickness measurement with multi-wavelength THz interferometry

T. D. Nguyen, Jesus Daniel Valera Robles, A. J. Moore*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

17 Citations (Scopus)
296 Downloads (Pure)

Fingerprint

Dive into the research topics of 'Optical thickness measurement with multi-wavelength THz interferometry'. Together they form a unique fingerprint.

INIS

Engineering

Material Science