Optical probing of a silicon integrated circuit using electric-field- induced second-harmonic generation

INIS

• electric fields 100%
• integrated circuits 100%
• silicon 100%
• second-harmonic generation 100%
• harmonics 100%
• efficiency 50%
• geometry 50%
• devices 50%
• conversion 50%
• semiconductor materials 50%
• pulses 50%
• wavelengths 50%
• signals 50%
• oxides 50%
• metals 50%
• incidents 50%

Engineering

• Integrated Circuit 100%
• Harmonics 100%
• Induced Electric Field 100%
• Harmonic Generation 100%
• Femtosecond Pulse 50%
• Conversion Efficiency 50%
• Electrical Signal 50%
• Signal Present 50%
• CMOS Integrated Circuits 50%
• Dependent Behavior 50%

Physics

• Electric Fields 100%
• Integrated Circuit 100%
• Second Harmonic Generation 100%
• Harmonics 100%
• Metal Oxide Semiconductor 50%