Online view sampling for estimating depth from light fields

Changil Kim; Kartic Subr; Kenny Mitchell; Alexander Sorkine-Hornung; Markus Gross

Online view sampling for estimating depth from light fields

Changil Kim
, Kartic Subr
, Kenny Mitchell
, Alexander Sorkine-Hornung
, Markus Gross

Research output: Contribution to conference › Paper › peer-review

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Abstract

Geometric information such as depth obtained from light fields
finds more applications recently. Where and how to sample
images to populate a light field is an important problem to
maximize the usability of information gathered for depth reconstruction.
We propose a simple analysis model for view
sampling and an adaptive, online sampling algorithm tailored
to light field depth reconstruction. Our model is based on the
trade-off between visibility and depth resolvability for varying
sampling locations, and seeks the optimal locations that best
balance the two conflicting criteria.

Original language	English
Publication status	Published - 23 Sept 2015
Event	22nd IEEE International Conference on Image Processing 2015 - Quebec City, Canada Duration: 27 Sept 2015 → 30 Sept 2015 Conference number: 22

Conference

Conference	22nd IEEE International Conference on Image Processing 2015
Abbreviated title	ICIP 2015
Country/Territory	Canada
City	Quebec City
Period	27/09/15 → 30/09/15

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title = "Online view sampling for estimating depth from light fields",

abstract = "Geometric information such as depth obtained from light fields finds more applications recently. Where and how to sample images to populate a light field is an important problem to maximize the usability of information gathered for depth reconstruction. We propose a simple analysis model for view sampling and an adaptive, online sampling algorithm tailored to light field depth reconstruction. Our model is based on the trade-off between visibility and depth resolvability for varying sampling locations, and seeks the optimal locations that best balance the two conflicting criteria.",

author = "Changil Kim and Kartic Subr and Kenny Mitchell and Alexander Sorkine-Hornung and Markus Gross",

year = "2015",

month = sep,

day = "23",

language = "English",

note = "22nd IEEE International Conference on Image Processing 2015, ICIP 2015 ; Conference date: 27-09-2015 Through 30-09-2015",

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TY - CONF

T1 - Online view sampling for estimating depth from light fields

AU - Kim, Changil

AU - Subr, Kartic

AU - Mitchell, Kenny

AU - Sorkine-Hornung, Alexander

AU - Gross, Markus

N1 - Conference code: 22

PY - 2015/9/23

Y1 - 2015/9/23

N2 - Geometric information such as depth obtained from light fields finds more applications recently. Where and how to sample images to populate a light field is an important problem to maximize the usability of information gathered for depth reconstruction. We propose a simple analysis model for view sampling and an adaptive, online sampling algorithm tailored to light field depth reconstruction. Our model is based on the trade-off between visibility and depth resolvability for varying sampling locations, and seeks the optimal locations that best balance the two conflicting criteria.

AB - Geometric information such as depth obtained from light fields finds more applications recently. Where and how to sample images to populate a light field is an important problem to maximize the usability of information gathered for depth reconstruction. We propose a simple analysis model for view sampling and an adaptive, online sampling algorithm tailored to light field depth reconstruction. Our model is based on the trade-off between visibility and depth resolvability for varying sampling locations, and seeks the optimal locations that best balance the two conflicting criteria.

M3 - Paper

T2 - 22nd IEEE International Conference on Image Processing 2015

Y2 - 27 September 2015 through 30 September 2015

ER -

Online view sampling for estimating depth from light fields

Abstract

Conference

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