Nucleated dewetting of thin polymer films

C. Lorenz-Haas; P. Müller-Buschbaum; J. Kraus; D. G. Bucknall; M. Stamm

doi:10.1007/s003390201347

Nucleated dewetting of thin polymer films

C. Lorenz-Haas^*, P. Müller-Buschbaum, J. Kraus, D. G. Bucknall, M. Stamm

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

14 Citations (Scopus)

Abstract

A combination of optical microscopy and neutron reflectometry is utilized to investigate the dewetting caused by a nucleation and growth process. The model system is polystyrene (PS) on top of Si (100) with its native oxide layer. Nucleation is forced by the introduction of additional grains during the sample preparation. From neutron scattering the density profile as an averaged piece of information is gained. Optical microscopy enables the in-situ determination of lateral local structures. The growth of the hole area of individual holes is described within the Kolmogorov model. The growth exponent as a function of annealing time of all holes investigated shows a linear increase.

Original language	English
Pages (from-to)	S383-S385
Number of pages	3
Journal	Applied Physics A: Materials Science and Processing
Volume	74
Issue number	SUPPL.I
DOIs	https://doi.org/10.1007/s003390201347
Publication status	Published - Dec 2002

ASJC Scopus subject areas

General Materials Science
Physics and Astronomy (miscellaneous)

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title = "Nucleated dewetting of thin polymer films",

abstract = "A combination of optical microscopy and neutron reflectometry is utilized to investigate the dewetting caused by a nucleation and growth process. The model system is polystyrene (PS) on top of Si (100) with its native oxide layer. Nucleation is forced by the introduction of additional grains during the sample preparation. From neutron scattering the density profile as an averaged piece of information is gained. Optical microscopy enables the in-situ determination of lateral local structures. The growth of the hole area of individual holes is described within the Kolmogorov model. The growth exponent as a function of annealing time of all holes investigated shows a linear increase.",

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AU - Lorenz-Haas, C.

AU - Müller-Buschbaum, P.

AU - Kraus, J.

AU - Bucknall, D. G.

AU - Stamm, M.

PY - 2002/12

Y1 - 2002/12

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AB - A combination of optical microscopy and neutron reflectometry is utilized to investigate the dewetting caused by a nucleation and growth process. The model system is polystyrene (PS) on top of Si (100) with its native oxide layer. Nucleation is forced by the introduction of additional grains during the sample preparation. From neutron scattering the density profile as an averaged piece of information is gained. Optical microscopy enables the in-situ determination of lateral local structures. The growth of the hole area of individual holes is described within the Kolmogorov model. The growth exponent as a function of annealing time of all holes investigated shows a linear increase.

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DO - 10.1007/s003390201347

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AN - SCOPUS:0036999434

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SP - S383-S385

JO - Applied Physics A: Materials Science and Processing

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IS - SUPPL.I

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Nucleated dewetting of thin polymer films

Abstract

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