Nonlinear refraction and absorption in an InGaAsP waveguide containing an InGaAs single quantum well

J. E. Ehrlich, D. T. Neilson, D. J. Goodwill, A. C. Walker, C. Johnston, W. Sibbett

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

Nonlinear refractive and absorption cross sections are measured, ofInGaAs SQW both into and away from the fundamental band edge for TE and TM polarizations. Band edge vicinity increase in refractive cross section is measured. For wavelengths of 90 nm away from band edge, greater than p/2 cavity phase changes are achieved.

Original languageEnglish
Pages (from-to)492-495
Number of pages4
JournalJournal of the Optical Society of America B: Optical Physics
Volume10
Issue number3
Publication statusPublished - Mar 1993

Fingerprint

Dive into the research topics of 'Nonlinear refraction and absorption in an InGaAsP waveguide containing an InGaAs single quantum well'. Together they form a unique fingerprint.

Cite this