Nonlinear refractive and absorption cross sections are measured, ofInGaAs SQW both into and away from the fundamental band edge for TE and TM polarizations. Band edge vicinity increase in refractive cross section is measured. For wavelengths of 90 nm away from band edge, greater than p/2 cavity phase changes are achieved.
|Number of pages||4|
|Journal||Journal of the Optical Society of America B: Optical Physics|
|Publication status||Published - Mar 1993|