Non-destructive X-Ray mapping of strain & warpage of die in packaged chips
- Jennifer Stopford*
- , Arthur Henry
- , Dionysios Manessis
- , Nick Bennett
- , Ken Horan
- , David Allen
- , Jochen Wittge
- , Lars Boettcher
- , Aidan Cowley
- , Patrick McNally
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution