Fingerprint
Dive into the research topics of 'Non-destructive X-Ray mapping of strain & warpage of die in packaged chips'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Non-destructive X-Ray mapping of strain & warpage of die in packaged chips
Jennifer Stopford*, Arthur Henry, Dionysios Manessis, Nick Bennett, Ken Horan, David Allen, Jochen Wittge, Lars Boettcher, Aidan Cowley, Patrick McNally
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
6
Citations
(Scopus)