Noise characterization and optical frequency measurement with an optical parametric oscillator frequency comb

S. Schilt, Karolis Balskus, V. J. Wittwer, P. Brochard, T. Ploetzing, N. Jornod, Richard A. McCracken, Zhaowei Zhang, A. Bartels, Derryck Telford Reid, T. Sudmeyer

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication8th Symposium on Frequency Standards and Optical Metrology
Publication statusAccepted/In press - 2015
Event8th Symposium on Frequency Standards and Metrology 2015 - Potsdam, Germany
Duration: 12 Oct 201516 Oct 2015

Conference

Conference8th Symposium on Frequency Standards and Metrology 2015
CountryGermany
CityPotsdam
Period12/10/1516/10/15

Cite this

Schilt, S., Balskus, K., Wittwer, V. J., Brochard, P., Ploetzing, T., Jornod, N., McCracken, R. A., Zhang, Z., Bartels, A., Reid, D. T., & Sudmeyer, T. (Accepted/In press). Noise characterization and optical frequency measurement with an optical parametric oscillator frequency comb. In 8th Symposium on Frequency Standards and Optical Metrology