Noise characterization and optical frequency measurement with an optical parametric oscillator frequency comb

S. Schilt; Karolis Balskus; V. J. Wittwer; P. Brochard; T. Ploetzing; N. Jornod; Richard A. McCracken; Zhaowei Zhang; A. Bartels; Derryck Telford Reid; T. Südmeyer

Noise characterization and optical frequency measurement with an optical parametric oscillator frequency comb

S. Schilt, Karolis Balskus, V. J. Wittwer, P. Brochard, T. Ploetzing, N. Jornod, Richard A. McCracken, Zhaowei Zhang, A. Bartels, Derryck Telford Reid, T. Südmeyer

Research output: Contribution to conference › Paper › peer-review

Original language	English
Pages	143
Number of pages	1
Publication status	Published - 2015
Event	8th Symposium on Frequency Standards and Metrology 2015 - Potsdam, Germany Duration: 12 Oct 2015 → 16 Oct 2015

Conference

Conference	8th Symposium on Frequency Standards and Metrology 2015
Country/Territory	Germany
City	Potsdam
Period	12/10/15 → 16/10/15

Cite this

Schilt, S., Balskus, K., Wittwer, V. J., Brochard, P., Ploetzing, T., Jornod, N., McCracken, R. A., Zhang, Z., Bartels, A., Reid, D. T., & Südmeyer, T. (2015). Noise characterization and optical frequency measurement with an optical parametric oscillator frequency comb. 143. Paper presented at 8th Symposium on Frequency Standards and Metrology 2015, Potsdam, Germany.

@conference{989442e9422e4823af768d4a1d020dc2,

title = "Noise characterization and optical frequency measurement with an optical parametric oscillator frequency comb",

author = "S. Schilt and Karolis Balskus and Wittwer, {V. J.} and P. Brochard and T. Ploetzing and N. Jornod and McCracken, {Richard A.} and Zhaowei Zhang and A. Bartels and Reid, {Derryck Telford} and T. S{\"u}dmeyer",

year = "2015",

language = "English",

pages = "143",

note = "8th Symposium on Frequency Standards and Metrology 2015 ; Conference date: 12-10-2015 Through 16-10-2015",

}

Schilt, S, Balskus, K, Wittwer, VJ, Brochard, P, Ploetzing, T, Jornod, N, McCracken, RA, Zhang, Z, Bartels, A, Reid, DT & Südmeyer, T 2015, 'Noise characterization and optical frequency measurement with an optical parametric oscillator frequency comb', Paper presented at 8th Symposium on Frequency Standards and Metrology 2015, Potsdam, Germany, 12/10/15 - 16/10/15 pp. 143.

TY - CONF

T1 - Noise characterization and optical frequency measurement with an optical parametric oscillator frequency comb

AU - Schilt, S.

AU - Balskus, Karolis

AU - Wittwer, V. J.

AU - Brochard, P.

AU - Ploetzing, T.

AU - Jornod, N.

AU - McCracken, Richard A.

AU - Zhang, Zhaowei

AU - Bartels, A.

AU - Reid, Derryck Telford

AU - Südmeyer, T.

PY - 2015

Y1 - 2015

M3 - Paper

SP - 143

T2 - 8th Symposium on Frequency Standards and Metrology 2015

Y2 - 12 October 2015 through 16 October 2015

ER -