Nanoscale optical microscopy in the vectorial focusing regime

K. A. Serreis, E. Ramsay, R. J. Warburton, D. T. Reid

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

By using extreme numerical-aperture solid-immersion microscopy at 1553nm we demonstrate, under certain circumstances, polarization-sensitive imaging with resolution values approaching lOOnm which substantially surpass the classical scalar diffraction-limit embodied by Sparrow's resolution criterion. © 2008 Optical Society of America.

Original languageEnglish
Title of host publication2008 Conference on and Quantum Electronics and Laser Science Conference Lasers and Electro-Optics, QELS
DOIs
Publication statusPublished - 2008
EventConference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference 2008 - San Jose
Duration: 4 May 20089 May 2008

Conference

ConferenceConference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference 2008
Abbreviated titleCLEO/QELS 2008
CitySan Jose
Period4/05/089/05/08

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