Nanoscale optical microscopy in the vectorial focusing regime

K. A. Serreis; E. Ramsay; R. J. Warburton; D. T. Reid

doi:10.1109/QELS.2008.4553101

Nanoscale optical microscopy in the vectorial focusing regime

K. A. Serreis, E. Ramsay, R. J. Warburton, D. T. Reid

School of Engineering & Physical Sciences

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

By using extreme numerical-aperture solid-immersion microscopy at 1553nm we demonstrate, under certain circumstances, polarization-sensitive imaging with resolution values approaching lOOnm which substantially surpass the classical scalar diffraction-limit embodied by Sparrow's resolution criterion. © 2008 Optical Society of America.

Original language	English
Title of host publication	2008 Conference on and Quantum Electronics and Laser Science Conference Lasers and Electro-Optics, QELS
DOIs	https://doi.org/10.1109/QELS.2008.4553101
Publication status	Published - 2008
Event	Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference 2008 - San Jose Duration: 4 May 2008 → 9 May 2008

Conference

Conference	Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference 2008
Abbreviated title	CLEO/QELS 2008
City	San Jose
Period	4/05/08 → 9/05/08

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10.1109/QELS.2008.4553101

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@inproceedings{325b79b1a56b4190acfc7f9e5d084428,

title = "Nanoscale optical microscopy in the vectorial focusing regime",

abstract = "By using extreme numerical-aperture solid-immersion microscopy at 1553nm we demonstrate, under certain circumstances, polarization-sensitive imaging with resolution values approaching lOOnm which substantially surpass the classical scalar diffraction-limit embodied by Sparrow's resolution criterion. {\textcopyright} 2008 Optical Society of America.",

author = "Serreis, {K. A.} and E. Ramsay and Warburton, {R. J.} and Reid, {D. T.}",

note = "EP/C509765/1; Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference 2008, CLEO/QELS 2008 ; Conference date: 04-05-2008 Through 09-05-2008",

year = "2008",

doi = "10.1109/QELS.2008.4553101",

language = "English",

isbn = "1557528594",

booktitle = "2008 Conference on and Quantum Electronics and Laser Science Conference Lasers and Electro-Optics, QELS",

}

Serreis, KA, Ramsay, E, Warburton, RJ & Reid, DT 2008, Nanoscale optical microscopy in the vectorial focusing regime. in 2008 Conference on and Quantum Electronics and Laser Science Conference Lasers and Electro-Optics, QELS. Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference 2008, San Jose, 4/05/08. https://doi.org/10.1109/QELS.2008.4553101

TY - GEN

T1 - Nanoscale optical microscopy in the vectorial focusing regime

AU - Serreis, K. A.

AU - Ramsay, E.

AU - Warburton, R. J.

AU - Reid, D. T.

N1 - EP/C509765/1

PY - 2008

Y1 - 2008

N2 - By using extreme numerical-aperture solid-immersion microscopy at 1553nm we demonstrate, under certain circumstances, polarization-sensitive imaging with resolution values approaching lOOnm which substantially surpass the classical scalar diffraction-limit embodied by Sparrow's resolution criterion. © 2008 Optical Society of America.

AB - By using extreme numerical-aperture solid-immersion microscopy at 1553nm we demonstrate, under certain circumstances, polarization-sensitive imaging with resolution values approaching lOOnm which substantially surpass the classical scalar diffraction-limit embodied by Sparrow's resolution criterion. © 2008 Optical Society of America.

UR - http://www.scopus.com/inward/record.url?scp=51349103049&partnerID=8YFLogxK

U2 - 10.1109/QELS.2008.4553101

DO - 10.1109/QELS.2008.4553101

M3 - Conference contribution

SN - 1557528594

SN - 9781557528599

BT - 2008 Conference on and Quantum Electronics and Laser Science Conference Lasers and Electro-Optics, QELS

T2 - Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference 2008

Y2 - 4 May 2008 through 9 May 2008

ER -

Nanoscale optical microscopy in the vectorial focusing regime

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