MULTILAYER THEORY OF X-RAY REFLECTION.

P. G. Harper; S. K. Ramchurn

MULTILAYER THEORY OF X-RAY REFLECTION.

P. G. Harper, S. K. Ramchurn

School of Engineering & Physical Sciences

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

A new basis is presented for the calculation of reflection coefficients of x-rays by multilayer artifacts. Thin film interference is treated at atomic plane level, using an iterative 2 multiplied by 2 matrix method. Analytic and computational comparisons are made with the conventional dielectric approach for TM and TE polarisations at non-normal incidence. Good agreement is obtained with recent accurate measurements by Evans.

Original language	English
Title of host publication	Proceedings of SPIE - The International Society for Optical Engineering
Pages	324-332
Number of pages	9
Volume	733
Publication status	Published - 1987

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title = "MULTILAYER THEORY OF X-RAY REFLECTION.",

abstract = "A new basis is presented for the calculation of reflection coefficients of x-rays by multilayer artifacts. Thin film interference is treated at atomic plane level, using an iterative 2 multiplied by 2 matrix method. Analytic and computational comparisons are made with the conventional dielectric approach for TM and TE polarisations at non-normal incidence. Good agreement is obtained with recent accurate measurements by Evans.",

author = "Harper, {P. G.} and Ramchurn, {S. K.}",

year = "1987",

language = "English",

isbn = "0892527684",

volume = "733",

pages = "324--332",

booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",

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TY - GEN

T1 - MULTILAYER THEORY OF X-RAY REFLECTION.

AU - Harper, P. G.

AU - Ramchurn, S. K.

PY - 1987

Y1 - 1987

N2 - A new basis is presented for the calculation of reflection coefficients of x-rays by multilayer artifacts. Thin film interference is treated at atomic plane level, using an iterative 2 multiplied by 2 matrix method. Analytic and computational comparisons are made with the conventional dielectric approach for TM and TE polarisations at non-normal incidence. Good agreement is obtained with recent accurate measurements by Evans.

AB - A new basis is presented for the calculation of reflection coefficients of x-rays by multilayer artifacts. Thin film interference is treated at atomic plane level, using an iterative 2 multiplied by 2 matrix method. Analytic and computational comparisons are made with the conventional dielectric approach for TM and TE polarisations at non-normal incidence. Good agreement is obtained with recent accurate measurements by Evans.

UR - http://www.scopus.com/inward/record.url?scp=0023545023&partnerID=8YFLogxK

M3 - Conference contribution

SN - 0892527684

VL - 733

SP - 324

EP - 332

BT - Proceedings of SPIE - The International Society for Optical Engineering

ER -