MULTILAYER THEORY OF X-RAY REFLECTION.

P. G. Harper, S. K. Ramchurn

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A new basis is presented for the calculation of reflection coefficients of x-rays by multilayer artifacts. Thin film interference is treated at atomic plane level, using an iterative 2 multiplied by 2 matrix method. Analytic and computational comparisons are made with the conventional dielectric approach for TM and TE polarisations at non-normal incidence. Good agreement is obtained with recent accurate measurements by Evans.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Pages324-332
Number of pages9
Volume733
Publication statusPublished - 1987

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matrix methods
artifacts
incidence
reflectance
interference
polarization
thin films
x rays

Cite this

Harper, P. G., & Ramchurn, S. K. (1987). MULTILAYER THEORY OF X-RAY REFLECTION. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 733, pp. 324-332)
Harper, P. G. ; Ramchurn, S. K. / MULTILAYER THEORY OF X-RAY REFLECTION. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 733 1987. pp. 324-332
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Harper, PG & Ramchurn, SK 1987, MULTILAYER THEORY OF X-RAY REFLECTION. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 733, pp. 324-332.

MULTILAYER THEORY OF X-RAY REFLECTION. / Harper, P. G.; Ramchurn, S. K.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 733 1987. p. 324-332.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Harper PG, Ramchurn SK. MULTILAYER THEORY OF X-RAY REFLECTION. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 733. 1987. p. 324-332