Abstract
A new basis is presented for the calculation of reflection coefficients of x-rays by multilayer artifacts. Thin film interference is treated at atomic plane level, using an iterative 2 multiplied by 2 matrix method. Analytic and computational comparisons are made with the conventional dielectric approach for TM and TE polarisations at non-normal incidence. Good agreement is obtained with recent accurate measurements by Evans.
| Original language | English |
|---|---|
| Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |
| Pages | 324-332 |
| Number of pages | 9 |
| Volume | 733 |
| Publication status | Published - 1987 |
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MULTILAYER THEORY OF X-RAY REFLECTION. / Harper, P. G.; Ramchurn, S. K.
Proceedings of SPIE - The International Society for Optical Engineering. Vol. 733 1987. p. 324-332.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
TY - GEN
T1 - MULTILAYER THEORY OF X-RAY REFLECTION.
AU - Harper, P. G.
AU - Ramchurn, S. K.
PY - 1987
Y1 - 1987
N2 - A new basis is presented for the calculation of reflection coefficients of x-rays by multilayer artifacts. Thin film interference is treated at atomic plane level, using an iterative 2 multiplied by 2 matrix method. Analytic and computational comparisons are made with the conventional dielectric approach for TM and TE polarisations at non-normal incidence. Good agreement is obtained with recent accurate measurements by Evans.
AB - A new basis is presented for the calculation of reflection coefficients of x-rays by multilayer artifacts. Thin film interference is treated at atomic plane level, using an iterative 2 multiplied by 2 matrix method. Analytic and computational comparisons are made with the conventional dielectric approach for TM and TE polarisations at non-normal incidence. Good agreement is obtained with recent accurate measurements by Evans.
UR - http://www.scopus.com/inward/record.url?scp=0023545023&partnerID=8YFLogxK
M3 - Conference contribution
SN - 0892527684
VL - 733
SP - 324
EP - 332
BT - Proceedings of SPIE - The International Society for Optical Engineering
ER -