Model-free classification of X-ray scattering signals applied to image segmentation

Viviane Lutz-Bueno, C. Arboleda, Leon Leu, Martin J. Blunt, Andreas Busch, A. Georgiadis, Pieter Bertier, J. Schmatz, Z. Varga, P. Villanueva-Perez, Z. Wang, M. Lebugle, C. David, M. Stampanoni, A. Diaz, M. Guizar-Sicairos, A. Menzel

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4 Citations (Scopus)
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Engineering & Materials Science