Mm-wave low-profile reflection polarizer

  • Efstratios Doumanis*
  • , George Goussetis
  • , José Luis Gómez-Tornero
  • , Robert Cahill
  • , Vincent Fusco
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper proposes a mm-wave low-profile reflection polarizer based on single layer anisotropic impedance surfaces. It is demonstrated that by virtue of anisotropy it is possible to independently control the reflection characteristics of the two orthogonal components of a linearly-polarized incident plane waves and therefore achieve polarization conversion. A W-band prototype has been designed and its performance characteristics are evaluated. The 1.5 dB axial ratio relative bandwidth exceeds 51 %, while low loss and better than previously reported angular stability are also demonstrated. The structure is compatible with traditional PCB etching techniques and does not require stacking of multiple layers.

Original languageEnglish
Title of host publication2011 IEEE MTT-S International Microwave Workshop Series on Millimeter Wave Integration Technologies, IMWS 2011
Pages180-183
Number of pages4
ISBN (Electronic)978-1-61284-965-2
DOIs
Publication statusPublished - 2011
Event2011 IEEE MTT-S International Microwave Workshop on Millimeter Wave Integration Technologies, IMWS 2011, Collocated with the 2011 IEEE RFID - Technologies and Applications Conference, RFID-TA 2011 - Sitges, Spain
Duration: 15 Sept 201116 Sept 2011

Conference

Conference2011 IEEE MTT-S International Microwave Workshop on Millimeter Wave Integration Technologies, IMWS 2011, Collocated with the 2011 IEEE RFID - Technologies and Applications Conference, RFID-TA 2011
Country/TerritorySpain
CitySitges
Period15/09/1116/09/11

Keywords

  • Anisotropy
  • Circular polarization
  • HIS
  • imaging systems
  • mm-waves
  • polarizer
  • W-Band

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Electrical and Electronic Engineering

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