Minimization of baseband electrical memory effects in GaN HEMTs using active IF load-pull

M. Akmal, J. Lees, V. Carrubba, S. Ben Smida, S. Woodington, J. Benedikt, K. Morris, M. Beach, J. McGeehan, P. J. Tasker

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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