Abstract
The recently reported effect of luminescence quenching by a mid-infrared (MIR) pulse from a free-electron laser was investigated in various Si:Er materials. No quenching was observed in Si:Er samples whose photoluminescence spectra were dominated by the so-called 'cubic' centers. Furthermore, in addition to the low-symmetry Er-related spectra, the MIR-induced quenching was found to take place also for a broad emission band centered around 1.4 µm, and usually assigned to implantation damage. The band-edge excitonic emission remained unaffected by the MIR radiation. © 2001 Elsevier Science B.V.
| Original language | English |
|---|---|
| Pages (from-to) | 80-82 |
| Number of pages | 3 |
| Journal | Materials Science and Engineering: B |
| Volume | 81 |
| Issue number | 1-3 |
| DOIs | |
| Publication status | Published - 24 Apr 2001 |
Keywords
- Erbium
- Free-electron laser
- Photoluminescence
- Silicon
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