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Microstructural investigation of mudrock seals using nanometer-scale resolution techniques
A. Rezaeyan*, V. Pipich, P. Bertier, T. Seemann, L. Leu, N. Kampman, A. Feoktystov, L. Barnsley, A. Busch
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
2
Citations
(Scopus)