Micro x-ray tomographic imaging of porous media

Richard A Williams, Xiaodong Jia, C. Selomulya

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Do not X-ray Microtomography (XMT) is a relatively new technology for measuring and characterising structures of materials at micron scales. It operates on the same principles as hospital CT scanners, but with much higher spatial resolution. The enhanced spatial resolution, portability and affordability, and the non-destructive nature of the measurement technique, are making XMT an increasingly popular means for scientists and engineers to measure or characterise structures of various materials in full 3D with unprecedented level of details. This paper reports on use of two such scanners and their application to porous media imaging.

Original languageEnglish
Title of host publicationMultiphase flow - the ultimate measurement challenge : proceedings of the 5th International Symposium on Measurement Techniques for Multiphase Flows; 2nd International Workshop on Process Tomography; Macau, China 10 - 13 December 2006
EditorsXiaoshu Cai
Pages3-11
Number of pages9
Volume914
DOIs
Publication statusPublished - 5 Jun 2007
Event5th International Symposium on Measurement Techniques for Multiphase Flows 2006 - Macau, China
Duration: 10 Dec 200613 Dec 2006

Publication series

NameAIP Conference Proceeding
Volume914

Conference

Conference5th International Symposium on Measurement Techniques for Multiphase Flows 2006
CountryChina
CityMacau
Period10/12/0613/12/06

Keywords

  • Flow
  • Imaging
  • Porous media
  • X-ray microtomography

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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  • Cite this

    Williams, R. A., Jia, X., & Selomulya, C. (2007). Micro x-ray tomographic imaging of porous media. In X. Cai (Ed.), Multiphase flow - the ultimate measurement challenge : proceedings of the 5th International Symposium on Measurement Techniques for Multiphase Flows; 2nd International Workshop on Process Tomography; Macau, China 10 - 13 December 2006 (Vol. 914, pp. 3-11). (AIP Conference Proceeding; Vol. 914). https://doi.org/10.1063/1.2747407