Abstract
Laser smoothing of reactive ion-etched (RIE) gratings and arbitrary multi-step structures in silica by a CO2 laser is shown to provide controlled relaxation of etched step features over scale lengths between 2μm and 30μm. Step heights of 1mm or less relax symmetrically, giving uniform edge softening. Asymmetry of the relaxation is seen for 3μm step height. However, the process enhances unwanted undercuts and grooves produced by etching errors. The process is promising for the production of low light scatter micro-optic components using low-cost binary or multi-level etched structures as a precursor.
Original language | English |
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Title of host publication | Optics InfoBase Conference Papers |
Publisher | OSA Publishing |
ISBN (Print) | 9781557528612 |
DOIs | |
Publication status | Published - 1 Jan 2008 |
Event | Optical Fabrication and Testing, OFT 2008 - Rochester, NY, United Kingdom Duration: 21 Oct 2008 → 24 Oct 2008 |
Conference
Conference | Optical Fabrication and Testing, OFT 2008 |
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Country/Territory | United Kingdom |
City | Rochester, NY |
Period | 21/10/08 → 24/10/08 |
ASJC Scopus subject areas
- Instrumentation
- Atomic and Molecular Physics, and Optics