Measuring propagation delays of critical paths using time-resolved LADA

K. Erington; D. Bodoh; K. A. Serrels; C. Nemirow; N. Leslie; T. R. Lundquist; P. Vedagarbha; C. Farrell; D. T. Reid

doi:10.1109/IRPS.2014.6860638

Measuring propagation delays of critical paths using time-resolved LADA

K. Erington, D. Bodoh, K. A. Serrels, C. Nemirow, N. Leslie, T. R. Lundquist, P. Vedagarbha, C. Farrell, D. T. Reid

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

12 Citations (Scopus)

Abstract

Laser-assisted device alteration is an established technique used to identify critical speed paths in integrated circuits. By using a synchronized pulsed laser, logic transition waveforms have been acquired that can be used to measure propagation delays of the critical path signals. A method for determining the polarity of the transitions is presented for LADA sites on bulk 28nm CMOS technology. The time-resolved LADA logic waveforms are compared to, and are in close agreement with, laser voltage probe waveforms acquired from the same device.

Original language	English
Title of host publication	Reliability Physics Symposium, 2014 IEEE International
Publisher	IEEE
Pages	3F.4.1-3F.4.5
Number of pages	5
ISBN (Print)	9781479933167
DOIs	https://doi.org/10.1109/IRPS.2014.6860638
Publication status	Published - 2014
Event	52nd IEEE International Reliability Physics Symposium - Waikoloa, HI, United States Duration: 1 Jun 2014 → 5 Jun 2014

Conference

Conference	52nd IEEE International Reliability Physics Symposium
Abbreviated title	IRPS 2014
Country/Territory	United States
City	Waikoloa, HI
Period	1/06/14 → 5/06/14

Keywords

Design Debug
Failure Analysis
Laser-Assisted Device Alteration (LADA)
Logic Transition Waveforms

Access to Document

10.1109/IRPS.2014.6860638

Cite this

@inproceedings{798c8c9ed6ee4a28972d27e53fbb2a0a,

title = "Measuring propagation delays of critical paths using time-resolved LADA",

abstract = "Laser-assisted device alteration is an established technique used to identify critical speed paths in integrated circuits. By using a synchronized pulsed laser, logic transition waveforms have been acquired that can be used to measure propagation delays of the critical path signals. A method for determining the polarity of the transitions is presented for LADA sites on bulk 28nm CMOS technology. The time-resolved LADA logic waveforms are compared to, and are in close agreement with, laser voltage probe waveforms acquired from the same device.",

keywords = "Design Debug, Failure Analysis, Laser-Assisted Device Alteration (LADA), Logic Transition Waveforms",

author = "K. Erington and D. Bodoh and Serrels, \{K. A.\} and C. Nemirow and N. Leslie and Lundquist, \{T. R.\} and P. Vedagarbha and C. Farrell and Reid, \{D. T.\}",

year = "2014",

doi = "10.1109/IRPS.2014.6860638",

language = "English",

isbn = "9781479933167",

pages = "3F.4.1--3F.4.5",

booktitle = "Reliability Physics Symposium, 2014 IEEE International",

publisher = "IEEE",

address = "United States",

note = "52nd IEEE International Reliability Physics Symposium, IRPS 2014 ; Conference date: 01-06-2014 Through 05-06-2014",

}

Erington, K, Bodoh, D, Serrels, KA, Nemirow, C, Leslie, N, Lundquist, TR, Vedagarbha, P, Farrell, C & Reid, DT 2014, Measuring propagation delays of critical paths using time-resolved LADA. in Reliability Physics Symposium, 2014 IEEE International. IEEE, pp. 3F.4.1-3F.4.5, 52nd IEEE International Reliability Physics Symposium, Waikoloa, HI, United States, 1/06/14. https://doi.org/10.1109/IRPS.2014.6860638

TY - GEN

T1 - Measuring propagation delays of critical paths using time-resolved LADA

AU - Erington, K.

AU - Bodoh, D.

AU - Serrels, K. A.

AU - Nemirow, C.

AU - Leslie, N.

AU - Lundquist, T. R.

AU - Vedagarbha, P.

AU - Farrell, C.

AU - Reid, D. T.

PY - 2014

Y1 - 2014

N2 - Laser-assisted device alteration is an established technique used to identify critical speed paths in integrated circuits. By using a synchronized pulsed laser, logic transition waveforms have been acquired that can be used to measure propagation delays of the critical path signals. A method for determining the polarity of the transitions is presented for LADA sites on bulk 28nm CMOS technology. The time-resolved LADA logic waveforms are compared to, and are in close agreement with, laser voltage probe waveforms acquired from the same device.

AB - Laser-assisted device alteration is an established technique used to identify critical speed paths in integrated circuits. By using a synchronized pulsed laser, logic transition waveforms have been acquired that can be used to measure propagation delays of the critical path signals. A method for determining the polarity of the transitions is presented for LADA sites on bulk 28nm CMOS technology. The time-resolved LADA logic waveforms are compared to, and are in close agreement with, laser voltage probe waveforms acquired from the same device.

KW - Design Debug

KW - Failure Analysis

KW - Laser-Assisted Device Alteration (LADA)

KW - Logic Transition Waveforms

U2 - 10.1109/IRPS.2014.6860638

DO - 10.1109/IRPS.2014.6860638

M3 - Conference contribution

AN - SCOPUS:84905654391

SN - 9781479933167

SP - 3F.4.1-3F.4.5

BT - Reliability Physics Symposium, 2014 IEEE International

PB - IEEE

T2 - 52nd IEEE International Reliability Physics Symposium

Y2 - 1 June 2014 through 5 June 2014

ER -

Measuring propagation delays of critical paths using time-resolved LADA

Abstract

Conference

Keywords

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