Measuring propagation delays of critical paths using time-resolved LADA

K. Erington, D. Bodoh, K. A. Serrels, C. Nemirow, N. Leslie, T. R. Lundquist, P. Vedagarbha, C. Farrell, D. T. Reid

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)

Abstract

Laser-assisted device alteration is an established technique used to identify critical speed paths in integrated circuits. By using a synchronized pulsed laser, logic transition waveforms have been acquired that can be used to measure propagation delays of the critical path signals. A method for determining the polarity of the transitions is presented for LADA sites on bulk 28nm CMOS technology. The time-resolved LADA logic waveforms are compared to, and are in close agreement with, laser voltage probe waveforms acquired from the same device.

Original languageEnglish
Title of host publicationReliability Physics Symposium, 2014 IEEE International
PublisherIEEE
Pages3F.4.1-3F.4.5
Number of pages5
ISBN (Print)9781479933167
DOIs
Publication statusPublished - 2014
Event52nd IEEE International Reliability Physics Symposium - Waikoloa, HI, United States
Duration: 1 Jun 20145 Jun 2014

Conference

Conference52nd IEEE International Reliability Physics Symposium
Abbreviated titleIRPS 2014
CountryUnited States
CityWaikoloa, HI
Period1/06/145/06/14

Keywords

  • Design Debug
  • Failure Analysis
  • Laser-Assisted Device Alteration (LADA)
  • Logic Transition Waveforms

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  • Cite this

    Erington, K., Bodoh, D., Serrels, K. A., Nemirow, C., Leslie, N., Lundquist, T. R., Vedagarbha, P., Farrell, C., & Reid, D. T. (2014). Measuring propagation delays of critical paths using time-resolved LADA. In Reliability Physics Symposium, 2014 IEEE International (pp. 3F.4.1-3F.4.5). IEEE. https://doi.org/10.1109/IRPS.2014.6860638