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Measurements by X-ray topography of the critical thickness of ZnSe grown on GaAs
C. B. O'Donnell, G. Lacey, G. Horsburgh, A. G. Cullis, C. R. Whitehouse, P. J. Parbrook, W. Meredith, I. Galbraith, P. Möck, K. A. Prior, B. C. Cavenett
Research output: Contribution to journal › Article › peer-review
10
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(Scopus)