Measurement of the orientation of the fast/slow axis and surface roughness for birefringent material

Jiamiao Lei, Wenxuan Liu, Yicheng Tuo, Steen G. Hanson, Mitsuo Takeda, Wei Wang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Abstract

When light propagates in a heterogeneous object, its propagation speed and refractive index value usually change with different vibration directions. However, when light passes through a heterogeneous optical crystal from a particular direction, no birefringence occurs, and this special direction is the optical axis of the birefringent material. Presently, the traditional measurement method for determining the optical axis relies on scalar imaging, which can only characterize scalars and cannot characterize polarization. Given the anisotropy of birefringent materials, it becomes difficult to determine the optical axis and measure the surface roughness. Speckle method, as an important non-contact measurement method, has gradually become the main method for measuring surface roughness due to its advantages such as small error and easy operation. The purpose of this article is to provide a device and method, to solve the problems of measuring the optical axis and roughness of birefringent materials, simultaneously.

Original languageEnglish
Title of host publicationSpeckle 2023
Subtitle of host publicationVIII International Conference on Speckle Metrology
EditorsWeiguo Liu, Wei Wang, Yechuan Zhu
PublisherSPIE
ISBN (Electronic)9781510674592
ISBN (Print)9781510674585
DOIs
Publication statusPublished - 4 Mar 2024
Event8th International Conference on Speckle Metrology 2023 - Xi'an, China
Duration: 18 Oct 202320 Oct 2023

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume13070
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference8th International Conference on Speckle Metrology 2023
Abbreviated titleSpeckle 2023
Country/TerritoryChina
CityXi'an
Period18/10/2320/10/23

Keywords

  • autocorrelation function
  • birefringence
  • laser speckle
  • Optical axis measurement
  • scattering imaging
  • surface roughness

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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