Measurement of the critical thickness of ZnCdSe quantum wells using the piezoelectric effect

Christian Morhain; J S Milnes; S A Telfer; B Urbaszek; Ian Galbraith; Kevin Alan Prior; B C Cavenett

Measurement of the critical thickness of ZnCdSe quantum wells using the piezoelectric effect

Christian Morhain, J S Milnes, S A Telfer, B Urbaszek, Ian Galbraith, Kevin Alan Prior, B C Cavenett

School of Engineering & Physical Sciences

Research output: Contribution to conference › Paper

Original language	English
Pages	353-356
Number of pages	4
Publication status	Published - 1998
Event	Blue Laser and Light Emitting Diodes II - Duration: 1 Jan 1998 → …

Conference

Conference	Blue Laser and Light Emitting Diodes II
Period	1/01/98 → …

Cite this

@conference{9506b429978b43d0a62e6e2c846a2be2,

title = "Measurement of the critical thickness of ZnCdSe quantum wells using the piezoelectric effect",

author = "Christian Morhain and Milnes, \{J S\} and Telfer, \{S A\} and B Urbaszek and Ian Galbraith and Prior, \{Kevin Alan\} and Cavenett, \{B C\}",

year = "1998",

language = "English",

pages = "353--356",

note = "Blue Laser and Light Emitting Diodes II ; Conference date: 01-01-1998",

}