Measurement of the critical thickness of ZnCdSe quantum wells using the piezoelectric effect

Christian Morhain, J S Milnes, S A Telfer, B Urbaszek, Ian Galbraith, Kevin Alan Prior, B C Cavenett

Research output: Contribution to conferencePaper

Original languageEnglish
Pages353-356
Number of pages4
Publication statusPublished - 1998
EventBlue Laser and Light Emitting Diodes II -
Duration: 1 Jan 1998 → …

Conference

ConferenceBlue Laser and Light Emitting Diodes II
Period1/01/98 → …

Cite this

Morhain, C., Milnes, J. S., Telfer, S. A., Urbaszek, B., Galbraith, I., Prior, K. A., & Cavenett, B. C. (1998). Measurement of the critical thickness of ZnCdSe quantum wells using the piezoelectric effect. 353-356. Paper presented at Blue Laser and Light Emitting Diodes II, .