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Measurement of the critical thickness of ZnCdSe quantum wells in ZnSe barrier layers by the piezoelectric effect
J S Milnes, Christian Morhain, S. A. Telfer, B. Urbaszek, I. Galbraith, K. A. Prior, B. C. Cavenett
Research output: Contribution to journal › Article › peer-review
5
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(Scopus)