Measurement of the critical thickness of ZnCdSe quantum wells in ZnSe barrier lavers by the piezoelectric effect

J S Milnes, Christian Morhain, S A Telfer, B Urbaszek, Kevin Alan Prior, B C Cavenett

Research output: Contribution to journal › Article › peer-review

Cite this

@article{37a08a126a9a48838b8cb68013e7680b,

title = "Measurement of the critical thickness of ZnCdSe quantum wells in ZnSe barrier lavers by the piezoelectric effect",

author = "Milnes, {J S} and Christian Morhain and Telfer, {S A} and B Urbaszek and Prior, {Kevin Alan} and Cavenett, {B C}",

year = "1998",

language = "English",

volume = "73",

pages = "3141--3143",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics Publising LLC",

}

TY - JOUR

T1 - Measurement of the critical thickness of ZnCdSe quantum wells in ZnSe barrier lavers by the piezoelectric effect

AU - Milnes, J S

AU - Morhain, Christian

AU - Telfer, S A

AU - Urbaszek, B

AU - Prior, Kevin Alan

AU - Cavenett, B C

PY - 1998

Y1 - 1998

M3 - Article

SN - 0003-6951

VL - 73

SP - 3141

EP - 3143

JO - Applied Physics Letters

JF - Applied Physics Letters

ER -