Measurement of the critical thickness of ZnCdSe quantum wells in ZnSe barrier lavers by the piezoelectric effect

J S Milnes, Christian Morhain, S A Telfer, B Urbaszek, Kevin Alan Prior, B C Cavenett

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)3141-3143
Number of pages3
JournalApplied Physics Letters
Volume73
Publication statusPublished - 1998

Cite this

Milnes, J. S., Morhain, C., Telfer, S. A., Urbaszek, B., Prior, K. A., & Cavenett, B. C. (1998). Measurement of the critical thickness of ZnCdSe quantum wells in ZnSe barrier lavers by the piezoelectric effect. Applied Physics Letters, 73, 3141-3143.