Measurement of complex surface deformation by high-speed dynamic phase-stepped digital speckle pattern interferometry

James M Kilpatrick, Andrew J. Moore, James S. Barton, J. D C Jones, Mark Reeves, Clive Buckberry

Research output: Contribution to journalArticle

42 Citations (Scopus)

Abstract

We describe a high-speed digital speckle pattern interferometer incorporating a line-scan camera and a waveguide phase modulator for the measurement of complex deformation (vibration phase and amplitude) at audio acoustic frequencies. Experimental data show continuous phase-stepped recovery of out-of-plane surface deformation in one dimension, obtained at 100 kHz with 2p/20-rad (0.02-µm) displacement resolution, for surface velocities of 3.2 mm s-1. © 2000 Optical Society of America.

Original languageEnglish
Pages (from-to)1068-1070
Number of pages3
JournalOptics Letters
Volume25
Issue number15
Publication statusPublished - 1 Aug 2000

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