Long-wavelength photovoltage spectroscopy using an electrolyte/semiconductor contact for semiconductor bandgap profiling

S. Y. Wang, K. A. Prior, B. C. Cavenett

Research output: Contribution to journalArticlepeer-review

Abstract

In this paper we demonstrate, for the first time, that photovoltage spectroscopy (PVS) with an aqueous electrolyte/semiconductor contact can be extended to the wavelength range of 1-2 µm by using an optical fibre which comes directly into contact with the semiconductor, thus avoiding the strong adsorption by the electrolyte which occurs in this spectral range. This technique is illustrated for lattice-matched In1-xGaxAs grown on InP having a bandgap of 0.74 eV corresponding to ?g = 1.67 µm. Thus, carrier and composition depth profiling can be carried out on ternary and quaternary alloys used for 1.3 µm and 1.5 µm optoelectronic devices.

Original languageEnglish
Pages (from-to)489-491
Number of pages3
JournalEngineering Optics
Volume6
Issue number4
Publication statusPublished - Nov 1993

Fingerprint

Dive into the research topics of 'Long-wavelength photovoltage spectroscopy using an electrolyte/semiconductor contact for semiconductor bandgap profiling'. Together they form a unique fingerprint.

Cite this