Abstract
Gold tracks of better than 98% purity have been deposited onto oxidized silicon wafers from gaseous methyl(triethylphosphine) gold(I), AuMe(Et 3 P), by using 514 nm radiation from a focused cw argon ion laser. Room-temperature resistivities of 4.2 µO cm, comparable with bulk gold, were attained at a writing speed of 35 µm s-1. The track profiles suggest that deposition is more rapid on the gold surface than on the SiO 2 substrate.
| Original language | English |
|---|---|
| Pages (from-to) | 1477-1479 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 55 |
| Issue number | 14 |
| DOIs | |
| Publication status | Published - 1989 |
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