Landmarks in the application of electrical tomography in particle science and technology

Richard A. Williams

doi:10.1016/j.partic.2010.07.017

Landmarks in the application of electrical tomography in particle science and technology

Richard A. Williams

School of Engineering & Physical Sciences

Research output: Contribution to journal › Article › peer-review

13 Citations (Scopus)

Abstract

Selected milestones in the development and use of electrical tomography in powder conveying, slurry processing and multi-phase flow are highlighted. The ability to map concentration in opaque mixtures under process-realistic conditions was a major innovation for the method and has had far reaching implications. Subsequent developments have enabled velocity information to be abstracted resulting in the ability to measure component flux and motion.

Original language	English
Pages (from-to)	493-497
Number of pages	5
Journal	Particuology
Volume	8
Issue number	6
DOIs	https://doi.org/10.1016/j.partic.2010.07.017
Publication status	Published - Dec 2010

Keywords

Computational fluid dynamics
Fault condition and maloperation
Flow measurement
Flow regime identification
Particle concentration
Process control
Process safety

ASJC Scopus subject areas

General Materials Science
Condensed Matter Physics

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10.1016/j.partic.2010.07.017

Cite this

@article{8f18f92af5164345afaa9211fecdc9c0,

title = "Landmarks in the application of electrical tomography in particle science and technology",

abstract = "Selected milestones in the development and use of electrical tomography in powder conveying, slurry processing and multi-phase flow are highlighted. The ability to map concentration in opaque mixtures under process-realistic conditions was a major innovation for the method and has had far reaching implications. Subsequent developments have enabled velocity information to be abstracted resulting in the ability to measure component flux and motion.",

keywords = "Computational fluid dynamics, Fault condition and maloperation, Flow measurement, Flow regime identification, Particle concentration, Process control, Process safety",

author = "Williams, \{Richard A.\}",

year = "2010",

month = dec,

doi = "10.1016/j.partic.2010.07.017",

language = "English",

volume = "8",

pages = "493--497",

journal = "Particuology",

issn = "1674-2001",

publisher = "Elsevier B.V.",

number = "6",

}

TY - JOUR

T1 - Landmarks in the application of electrical tomography in particle science and technology

AU - Williams, Richard A.

PY - 2010/12

Y1 - 2010/12

N2 - Selected milestones in the development and use of electrical tomography in powder conveying, slurry processing and multi-phase flow are highlighted. The ability to map concentration in opaque mixtures under process-realistic conditions was a major innovation for the method and has had far reaching implications. Subsequent developments have enabled velocity information to be abstracted resulting in the ability to measure component flux and motion.

AB - Selected milestones in the development and use of electrical tomography in powder conveying, slurry processing and multi-phase flow are highlighted. The ability to map concentration in opaque mixtures under process-realistic conditions was a major innovation for the method and has had far reaching implications. Subsequent developments have enabled velocity information to be abstracted resulting in the ability to measure component flux and motion.

KW - Computational fluid dynamics

KW - Fault condition and maloperation

KW - Flow measurement

KW - Flow regime identification

KW - Particle concentration

KW - Process control

KW - Process safety

UR - https://www.scopus.com/pages/publications/78649849481

U2 - 10.1016/j.partic.2010.07.017

DO - 10.1016/j.partic.2010.07.017

M3 - Article

AN - SCOPUS:78649849481

SN - 1674-2001

VL - 8

SP - 493

EP - 497

JO - Particuology

JF - Particuology

IS - 6

ER -

Landmarks in the application of electrical tomography in particle science and technology

Abstract

Keywords

ASJC Scopus subject areas

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