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Knowledge Capture in CMM Inspection Planning: Barriers and Challenges
Dimitrios Anagnostakis, James Millar Ritchie, Theodore Lim, Aparajithan Sivanathan, Rick Dewar, Raymond Sung, Frederic Nicolas Bosche, Ludovico Carozza
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
19
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(Scopus)
228
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