Kernel domain description with incomplete data: Using instance-specific margins to avoid imputation

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Abstract

We present a method of performing kernel space domain description of a dataset with incomplete entries without the need for imputation, allowing kernel features of a class of data with missing features to be rigorously described. This addresses the problem that absent data completion is usually required before kernel classifiers, such as support vector domain description (SVDD), can be applied; equally, few existing techniques for incomplete data adequately address the issue of kernel spaces. Our method, which we call instance-specific domain description (ISDD), uses a parametrisation framework to compute minimal kernelised distances between data points with missing features through a series of optimisation runs, allowing evaluation of the kernel distance while avoiding subjective completions of missing data. We compare results of our method against those achieved by SVDD applied to an imputed dataset, using synthetic and experimental datasets where feature absence has a non-trivial structure.We show that our methods can achieve tighter sphere bounds when applied to linear and quadratic kernels. © 2010 IEEE.

Original languageEnglish
Title of host publicationProceedings - 2010 20th International Conference on Pattern Recognition, ICPR 2010
Pages2921-2924
Number of pages4
DOIs
Publication statusPublished - 2010
Event2010 20th International Conference on Pattern Recognition - Istanbul, Turkey
Duration: 23 Aug 201026 Aug 2010

Conference

Conference2010 20th International Conference on Pattern Recognition
Abbreviated titleICPR 2010
CountryTurkey
CityIstanbul
Period23/08/1026/08/10

Keywords

  • Classification, regression, and ranking
  • Feature extraction, reduction, and analysis
  • Support vector machines and kernels

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  • Cite this

    Gripton, A., & Lu, W. (2010). Kernel domain description with incomplete data: Using instance-specific margins to avoid imputation. In Proceedings - 2010 20th International Conference on Pattern Recognition, ICPR 2010 (pp. 2921-2924) https://doi.org/10.1109/ICPR.2010.716