Investigation of three-dimensional imaging of a silicon flip-chip using two-photon optical beam induced current microscopy

E. Ramsay, D. T. Reid, K. Wilsher

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)1359-1360
Number of pages2
JournalOSA Trends in Optics and Photonics Series
Publication statusPublished - 2003
EventTrends in Optics and Photonics Series: Quantum electronics and Laser Science (QELS) - Baltimore, MD., United States
Duration: 1 Jun 20036 Jun 2003

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