Investigation of three-dimensional imaging of a silicon flip-chip using two-photon optical beam induced current microscopy

E. Ramsay, D. T. Reid, K. Wilsher

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1359-1360
Number of pages	2
Journal	OSA Trends in Optics and Photonics Series
Volume	88
Publication status	Published - 2003
Event	Trends in Optics and Photonics Series: Quantum electronics and Laser Science (QELS) - Baltimore, MD., United States Duration: 1 Jun 2003 → 6 Jun 2003

Cite this

@article{c5dd2c69e05f48e4b52cd6eab672138d,

title = "Investigation of three-dimensional imaging of a silicon flip-chip using two-photon optical beam induced current microscopy",

author = "E. Ramsay and Reid, {D. T.} and K. Wilsher",

year = "2003",

language = "English",

volume = "88",

pages = "1359--1360",

journal = "OSA Trends in Optics and Photonics Series",

note = "Trends in Optics and Photonics Series: Quantum electronics and Laser Science (QELS) ; Conference date: 01-06-2003 Through 06-06-2003",

}

TY - JOUR

T1 - Investigation of three-dimensional imaging of a silicon flip-chip using two-photon optical beam induced current microscopy

AU - Ramsay, E.

AU - Reid, D. T.

AU - Wilsher, K.

PY - 2003

Y1 - 2003

M3 - Article

VL - 88

SP - 1359

EP - 1360

JO - OSA Trends in Optics and Photonics Series

JF - OSA Trends in Optics and Photonics Series

T2 - Trends in Optics and Photonics Series: Quantum electronics and Laser Science (QELS)

Y2 - 1 June 2003 through 6 June 2003

ER -