Investigation of the two-photon optical beam induced current effect in silicon integrated circuits

E. Ramsay; D. T. Reid

doi:10.1016/S0030-4018(03)01540-2

Investigation of the two-photon optical beam induced current effect in silicon integrated circuits

E. Ramsay, D. T. Reid

School of Engineering & Physical Sciences

Research output: Contribution to journal › Article › peer-review

10 Citations (Scopus)

Abstract

We describe a simulation to model the two-photon optical beam induced current effect in silicon integrated circuits. Our model includes explicitly both the single-photon and two-photon absorption coefficients and explains how it is possible to obtain a three-dimensional image using this technique despite the relatively weak focal dependence. A full comparison with experimental results is also included. © 2003 Published by Elsevier Science B.V.

Original language	English
Pages (from-to)	427-433
Number of pages	7
Journal	Optics Communications
Volume	221
Issue number	4-6
DOIs	https://doi.org/10.1016/S0030-4018(03)01540-2
Publication status	Published - 15 Jun 2003

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10.1016/S0030-4018(03)01540-2

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abstract = "We describe a simulation to model the two-photon optical beam induced current effect in silicon integrated circuits. Our model includes explicitly both the single-photon and two-photon absorption coefficients and explains how it is possible to obtain a three-dimensional image using this technique despite the relatively weak focal dependence. A full comparison with experimental results is also included. {\textcopyright} 2003 Published by Elsevier Science B.V.",

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AU - Reid, D. T.

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AB - We describe a simulation to model the two-photon optical beam induced current effect in silicon integrated circuits. Our model includes explicitly both the single-photon and two-photon absorption coefficients and explains how it is possible to obtain a three-dimensional image using this technique despite the relatively weak focal dependence. A full comparison with experimental results is also included. © 2003 Published by Elsevier Science B.V.

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DO - 10.1016/S0030-4018(03)01540-2

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EP - 433

JO - Optics Communications

JF - Optics Communications

IS - 4-6

ER -

Investigation of the two-photon optical beam induced current effect in silicon integrated circuits

Abstract

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