Interface dependent magnetic moments in Cu/Co,Ni/Cu/Si(0 0 1) epitaxial structures

C. A F Vaz*, G. Lauhoff, J. A C Bland, S. Langridge, D. G. Bucknall, J. Penfold, J. Clarke, S. K. Halder, B. K. Tanner

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

9 Citations (Scopus)


The effect of the interface on the magnetic moment of Cu/Co,Ni/Cu/Si(0 0 1) epitaxial structures was studied by polarised neutron reflection (PNR). The structure consists of a specially designed three-step sample (single 60 Å Ni and 10 Å Co films and a 10 Å Co/60 Å Ni bilayer) grown under the same conditions in order to eliminate variations in the magnetic properties that could result from different growth environments. Independent structural characterisation of the samples was also determined from grazing incidence X-ray scattering, therefore increasing the confidence of the PNR fits. High precision PNR measurements performed at room temperature up to a wavevector range of 0.05 Å- 1 yield values of 0.58 ± 0.03 μB and 0.59 ± 0.03 μB per Ni atom for the Ni/Cu(0 0 1) and Co/Ni/Cu(0 0 1) samples, respectively; for the Co layers, the moments per Co atom are 1.63 ± 0.13 μB and 1.68 ± 0.11 μB for the Co/Ni/Cu(0 0 1) and Co/Cu(0 0 1) samples, respectively. Our results show that there are no significant changes in the respective Co and Ni magnetic moments at the Co/Ni interface.

Original languageEnglish
Pages (from-to)89-97
Number of pages9
JournalJournal of Magnetism and Magnetic Materials
Issue number1
Publication statusPublished - Jun 2007


  • Co
  • Grazing incidence X-ray scattering
  • Magnetic moment
  • Ni
  • Polarised neutron reflection

ASJC Scopus subject areas

  • Condensed Matter Physics


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