Infrared transient grating and photon echo spectroscopy of oxygen vibrational modes in amorphous silicon thin films

J. P R Wells; P. Jonathan Phillips; Nicolae Tomozeiu; F. H P M Habraken; Jaap I. Dijkhuis

Infrared transient grating and photon echo spectroscopy of oxygen vibrational modes in amorphous silicon thin films

J. P R Wells, P. Jonathan Phillips, Nicolae Tomozeiu, F. H P M Habraken, Jaap I. Dijkhuis

School of Engineering & Physical Sciences

Research output: Contribution to journal › Article › peer-review

11 Citations (Scopus)

Abstract

We report on picosecond coherent transient spectroscopy on the asymmetric stretching mode in a-SiO_0.1 thin films using the Dutch free-electron laser FELIX. A fast 10-K lifetime of 2.8 ps is obtained using laser-induced transient grating spectroscopy. Its thermal behavior suggests relaxation into two accepting modes possibly via the symmetric stretch mode of the Si-O-Si complex. Two-pulse photon echo measurements reveal phase dynamics with both an excitation density and temperature dependence, suggesting the presence of nonequilibrium Si-Si phonons. The temperature-dependent component of the pure dephasing may be attributable to two-phonon elastic scattering. From the probe pulse diffraction efficiency, a value of the nonlinear refractive index has been determined to be n₂ = 3.73 × 10^-3 cm ²/GW.

Original language	English
Article number	115207
Pages (from-to)	1152071-1152075
Number of pages	5
Journal	Physical Review B: Condensed Matter and Materials Physics
Volume	68
Issue number	11
Publication status	Published - Sept 2003

Cite this

@article{8ae6f91ae2474e06b695423c256c699a,

title = "Infrared transient grating and photon echo spectroscopy of oxygen vibrational modes in amorphous silicon thin films",

abstract = "We report on picosecond coherent transient spectroscopy on the asymmetric stretching mode in a-SiO0.1 thin films using the Dutch free-electron laser FELIX. A fast 10-K lifetime of 2.8 ps is obtained using laser-induced transient grating spectroscopy. Its thermal behavior suggests relaxation into two accepting modes possibly via the symmetric stretch mode of the Si-O-Si complex. Two-pulse photon echo measurements reveal phase dynamics with both an excitation density and temperature dependence, suggesting the presence of nonequilibrium Si-Si phonons. The temperature-dependent component of the pure dephasing may be attributable to two-phonon elastic scattering. From the probe pulse diffraction efficiency, a value of the nonlinear refractive index has been determined to be n2 = 3.73 × 10-3 cm 2/GW.",

author = "Wells, {J. P R} and Phillips, {P. Jonathan} and Nicolae Tomozeiu and Habraken, {F. H P M} and Dijkhuis, {Jaap I.}",

year = "2003",

month = sep,

language = "English",

volume = "68",

pages = "1152071--1152075",

journal = "Physical Review B: Condensed Matter and Materials Physics",

issn = "1098-0121",

publisher = "American Physical Society",

number = "11",

}

TY - JOUR

T1 - Infrared transient grating and photon echo spectroscopy of oxygen vibrational modes in amorphous silicon thin films

AU - Wells, J. P R

AU - Phillips, P. Jonathan

AU - Tomozeiu, Nicolae

AU - Habraken, F. H P M

AU - Dijkhuis, Jaap I.

PY - 2003/9

Y1 - 2003/9

N2 - We report on picosecond coherent transient spectroscopy on the asymmetric stretching mode in a-SiO0.1 thin films using the Dutch free-electron laser FELIX. A fast 10-K lifetime of 2.8 ps is obtained using laser-induced transient grating spectroscopy. Its thermal behavior suggests relaxation into two accepting modes possibly via the symmetric stretch mode of the Si-O-Si complex. Two-pulse photon echo measurements reveal phase dynamics with both an excitation density and temperature dependence, suggesting the presence of nonequilibrium Si-Si phonons. The temperature-dependent component of the pure dephasing may be attributable to two-phonon elastic scattering. From the probe pulse diffraction efficiency, a value of the nonlinear refractive index has been determined to be n2 = 3.73 × 10-3 cm 2/GW.

AB - We report on picosecond coherent transient spectroscopy on the asymmetric stretching mode in a-SiO0.1 thin films using the Dutch free-electron laser FELIX. A fast 10-K lifetime of 2.8 ps is obtained using laser-induced transient grating spectroscopy. Its thermal behavior suggests relaxation into two accepting modes possibly via the symmetric stretch mode of the Si-O-Si complex. Two-pulse photon echo measurements reveal phase dynamics with both an excitation density and temperature dependence, suggesting the presence of nonequilibrium Si-Si phonons. The temperature-dependent component of the pure dephasing may be attributable to two-phonon elastic scattering. From the probe pulse diffraction efficiency, a value of the nonlinear refractive index has been determined to be n2 = 3.73 × 10-3 cm 2/GW.

M3 - Article

SN - 1098-0121

VL - 68

SP - 1152071

EP - 1152075

JO - Physical Review B: Condensed Matter and Materials Physics

JF - Physical Review B: Condensed Matter and Materials Physics

IS - 11

M1 - 115207

ER -

Infrared transient grating and photon echo spectroscopy of oxygen vibrational modes in amorphous silicon thin films

Abstract

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