Infrared transient grating and photon echo spectroscopy of oxygen vibrational modes in amorphous silicon thin films

J. P R Wells, P. Jonathan Phillips, Nicolae Tomozeiu, F. H P M Habraken, Jaap I. Dijkhuis

Research output: Contribution to journalArticle

Abstract

We report on picosecond coherent transient spectroscopy on the asymmetric stretching mode in a-SiO0.1 thin films using the Dutch free-electron laser FELIX. A fast 10-K lifetime of 2.8 ps is obtained using laser-induced transient grating spectroscopy. Its thermal behavior suggests relaxation into two accepting modes possibly via the symmetric stretch mode of the Si-O-Si complex. Two-pulse photon echo measurements reveal phase dynamics with both an excitation density and temperature dependence, suggesting the presence of nonequilibrium Si-Si phonons. The temperature-dependent component of the pure dephasing may be attributable to two-phonon elastic scattering. From the probe pulse diffraction efficiency, a value of the nonlinear refractive index has been determined to be n2 = 3.73 × 10-3 cm 2/GW.

Original languageEnglish
Article number115207
Pages (from-to)1152071-1152075
Number of pages5
JournalPhysical Review B: Condensed Matter and Materials Physics
Volume68
Issue number11
Publication statusPublished - Sep 2003

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    Wells, J. P. R., Phillips, P. J., Tomozeiu, N., Habraken, F. H. P. M., & Dijkhuis, J. I. (2003). Infrared transient grating and photon echo spectroscopy of oxygen vibrational modes in amorphous silicon thin films. Physical Review B: Condensed Matter and Materials Physics, 68(11), 1152071-1152075. [115207].