Improved methods for the modeling and conduct of vertical interference tests across a tight zone

George Stewart, M. D. Jaafar, Kui Fu Du

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Original languageEnglish
    Title of host publicationProceedings: SPE Annual Technical Conference and Exhibition 1989
    Pages19798269-19798284
    Number of pages16
    VolumeSIGMA
    Publication statusPublished - 1989
    Event1989 SPE Annual Technical Conference and Exhibition - San Antonio, TX, United States
    Duration: 8 Oct 198911 Oct 1989

    Conference

    Conference1989 SPE Annual Technical Conference and Exhibition
    CountryUnited States
    CitySan Antonio, TX
    Period8/10/8911/10/89

    Cite this

    Stewart, G., Jaafar, M. D., & Du, K. F. (1989). Improved methods for the modeling and conduct of vertical interference tests across a tight zone. In Proceedings: SPE Annual Technical Conference and Exhibition 1989 (Vol. SIGMA, pp. 19798269-19798284)
    Stewart, George ; Jaafar, M. D. ; Du, Kui Fu. / Improved methods for the modeling and conduct of vertical interference tests across a tight zone. Proceedings: SPE Annual Technical Conference and Exhibition 1989. Vol. SIGMA 1989. pp. 19798269-19798284
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    author = "George Stewart and Jaafar, {M. D.} and Du, {Kui Fu}",
    year = "1989",
    language = "English",
    volume = "SIGMA",
    pages = "19798269--19798284",
    booktitle = "Proceedings: SPE Annual Technical Conference and Exhibition 1989",

    }

    Stewart, G, Jaafar, MD & Du, KF 1989, Improved methods for the modeling and conduct of vertical interference tests across a tight zone. in Proceedings: SPE Annual Technical Conference and Exhibition 1989. vol. SIGMA, pp. 19798269-19798284, 1989 SPE Annual Technical Conference and Exhibition, San Antonio, TX, United States, 8/10/89.

    Improved methods for the modeling and conduct of vertical interference tests across a tight zone. / Stewart, George; Jaafar, M. D.; Du, Kui Fu.

    Proceedings: SPE Annual Technical Conference and Exhibition 1989. Vol. SIGMA 1989. p. 19798269-19798284.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

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    AU - Jaafar, M. D.

    AU - Du, Kui Fu

    PY - 1989

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    M3 - Conference contribution

    VL - SIGMA

    SP - 19798269

    EP - 19798284

    BT - Proceedings: SPE Annual Technical Conference and Exhibition 1989

    ER -

    Stewart G, Jaafar MD, Du KF. Improved methods for the modeling and conduct of vertical interference tests across a tight zone. In Proceedings: SPE Annual Technical Conference and Exhibition 1989. Vol. SIGMA. 1989. p. 19798269-19798284