Abstract
We report the first measurement of inter-Landau level lifetimes in GaAs/GaAlAs-heterostructures. Saturation cyclotron resonance has been measured using a high intensity optically pumped far infrared laser. The results are analyzed on the basis of a three level model. The obtained lifetimes vary from 0.18 to 1.2 ns for samples with different carrier concentration. © 1985.
| Original language | English |
|---|---|
| Pages (from-to) | 323-326 |
| Number of pages | 4 |
| Journal | Physica B and C |
| Volume | 134 |
| Issue number | 1-3 |
| Publication status | Published - Nov 1985 |
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