High-speed phase-stepped digital speckle pattern interferometry using a complementary metal-oxide semiconductor camera

Tao Wu; J. D C Jones; Andrew J. Moore

doi:10.1364/AO.45.005845

High-speed phase-stepped digital speckle pattern interferometry using a complementary metal-oxide semiconductor camera

Tao Wu, J. D C Jones, Andrew J. Moore

School of Engineering & Physical Sciences

Research output: Contribution to journal › Article › peer-review

10 Citations (Scopus)

Abstract

A digital speckle pattern interferometer based on a complementary metal-oxide semiconductor (CMOS) camera is described. The temporal evolution of dynamic deformation is measured using interframe phase stepping. The flexibility of the CMOS detector is used to identify regions of interest with full-field time-averaged measurements and then to interrogate those regions with time-resolved measurements sampled at up to 70 kHz. A numerical and analytical investigation shows that the maximum surface velocity that can be reliably measured with interframe phase stepping corresponds to ±0.3 times the surface velocity at which the interferogram is sampled at the Nyquist limit. © 2006 Optical Society of America.

Original language	English
Pages (from-to)	5845-5855
Number of pages	11
Journal	Applied Optics
Volume	45
Issue number	23
DOIs	https://doi.org/10.1364/AO.45.005845
Publication status	Published - 10 Aug 2006

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abstract = "A digital speckle pattern interferometer based on a complementary metal-oxide semiconductor (CMOS) camera is described. The temporal evolution of dynamic deformation is measured using interframe phase stepping. The flexibility of the CMOS detector is used to identify regions of interest with full-field time-averaged measurements and then to interrogate those regions with time-resolved measurements sampled at up to 70 kHz. A numerical and analytical investigation shows that the maximum surface velocity that can be reliably measured with interframe phase stepping corresponds to ±0.3 times the surface velocity at which the interferogram is sampled at the Nyquist limit. {\textcopyright} 2006 Optical Society of America.",

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High-speed phase-stepped digital speckle pattern interferometry using a complementary metal-oxide semiconductor camera

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