High-speed multipoint vibrometer for modal analysis

S. Earl, T. Wu, J. D C Jones, A. J. Moore

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The use of a digital speckle pattern interferometer (SPI) based on a complementary metal-oxide semiconductor (CMOS) camera for vibration measurement is described. The flexibility of the CMOS detector enables regions of interest (ROIs) to be identified with full-field time-averaged measurements, and then to interrogate those regions with time-resolved measurements sampled at up to 70 kHz. The system effectively acts as a non-contact optical vibrometer that can measure surface velocity at several points simultaneously. The CMOS detector allows measurement of the vibration frequency, amplitude and relative phase between ROIs with high spatial and temporal resolution. The multi-point vibrometer was used to collect velocity information of a centre clamped circular plate that is subjected to transient excitation. The information is processed to determine the natural frequency mode shapes from velocity data for the first time.

Original languageEnglish
Title of host publicationSeventh International Conference on Vibration Measurements by Laser Techniques: Advances and Applications
Volume6345
DOIs
Publication statusPublished - 2006
EventSeventh International Conference on Vibration Measurements by Laser Techniques: Advances and Applications - Ancona, Italy
Duration: 19 Jun 200622 Jun 2006

Conference

ConferenceSeventh International Conference on Vibration Measurements by Laser Techniques: Advances and Applications
CountryItaly
CityAncona
Period19/06/0622/06/06

Keywords

  • CMOS camera
  • Modal analysis
  • Optical vibration measurement
  • Speckle pattern interferometry

Fingerprint Dive into the research topics of 'High-speed multipoint vibrometer for modal analysis'. Together they form a unique fingerprint.

Cite this