Abstract
The use of a digital speckle pattern interferometer (SPI) based on a complementary metal-oxide semiconductor (CMOS) camera for vibration measurement is described. The flexibility of the CMOS detector enables regions of interest (ROIs) to be identified with full-field time-averaged measurements, and then to interrogate those regions with time-resolved measurements sampled at up to 70 kHz. The system effectively acts as a non-contact optical vibrometer that can measure surface velocity at several points simultaneously. The CMOS detector allows measurement of the vibration frequency, amplitude and relative phase between ROIs with high spatial and temporal resolution. The multi-point vibrometer was used to collect velocity information of a centre clamped circular plate that is subjected to transient excitation. The information is processed to determine the natural frequency mode shapes from velocity data for the first time.
Original language | English |
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Title of host publication | Seventh International Conference on Vibration Measurements by Laser Techniques: Advances and Applications |
Volume | 6345 |
DOIs | |
Publication status | Published - 2006 |
Event | Seventh International Conference on Vibration Measurements by Laser Techniques: Advances and Applications - Ancona, Italy Duration: 19 Jun 2006 → 22 Jun 2006 |
Conference
Conference | Seventh International Conference on Vibration Measurements by Laser Techniques: Advances and Applications |
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Country/Territory | Italy |
City | Ancona |
Period | 19/06/06 → 22/06/06 |
Keywords
- CMOS camera
- Modal analysis
- Optical vibration measurement
- Speckle pattern interferometry