High sensitivity Ge-on-Si single-photon avalanche diode detectors

Lourdes Ferre Llin; Jarosław Kirdoda; Fiona Thorburn; Laura L. Huddleston; Zoë M. Greener; Kateryna Kuzmenko; Peter Vines; Derek C. S. Dumas; Ross W. Millar; Gerald S. Buller; Douglas J. Paul

doi:10.1364/OL.396756

High sensitivity Ge-on-Si single-photon avalanche diode detectors

Lourdes Ferre Llin, Jarosław Kirdoda, Fiona Thorburn, Laura L. Huddleston, Zoë M. Greener, Kateryna Kuzmenko, Peter Vines, Derek C. S. Dumas, Ross W. Millar, Gerald S. Buller, Douglas J. Paul^*

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

32 Citations (Scopus)

Abstract

The performance of planar geometry Ge-on-Si single-photon avalanche diode detectors of 26 µm diameter is presented. Record low dark count rates are observed, remaining less than 100 K counts per second at 6.6% excess bias and 125 K. Single-photon detection efficiencies are found to be up to 29.4%, and are shown to be temperature insensitive. These performance characteristics lead to a significantly reduced noise equivalent power (NEP) of 7.7 × 10⁻¹⁷ WHz^{− 12} compared to prior planar devices, and represent a two orders of magnitude reduction in NEP compared to previous Ge-on-Si mesa devices of a comparable diameter. Low jitter values of 134 ± 10 ps are demonstrated.

Original language	English
Pages (from-to)	6406-6409
Number of pages	4
Journal	Optics Letters
Volume	45
Issue number	23
Early online date	24 Nov 2020
DOIs	https://doi.org/10.1364/OL.396756
Publication status	Published - 1 Dec 2020

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Electrical and Electronic Engineering

Access to Document

10.1364/OL.396756

Cite this

@article{ea88ef90d3d346849cee250f564320a2,

title = "High sensitivity Ge-on-Si single-photon avalanche diode detectors",

abstract = "The performance of planar geometry Ge-on-Si single-photon avalanche diode detectors of 26 µm diameter is presented. Record low dark count rates are observed, remaining less than 100 K counts per second at 6.6% excess bias and 125 K. Single-photon detection efficiencies are found to be up to 29.4%, and are shown to be temperature insensitive. These performance characteristics lead to a significantly reduced noise equivalent power (NEP) of 7.7 × 10−17 WHz− 12 compared to prior planar devices, and represent a two orders of magnitude reduction in NEP compared to previous Ge-on-Si mesa devices of a comparable diameter. Low jitter values of 134 ± 10 ps are demonstrated.",

author = "Llin, {Lourdes Ferre} and Jaros{\l}aw Kirdoda and Fiona Thorburn and Huddleston, {Laura L.} and Greener, {Zo{\"e} M.} and Kateryna Kuzmenko and Peter Vines and Dumas, {Derek C. S.} and Millar, {Ross W.} and Buller, {Gerald S.} and Paul, {Douglas J.}",

year = "2020",

month = dec,

day = "1",

doi = "10.1364/OL.396756",

language = "English",

volume = "45",

pages = "6406--6409",

journal = "Optics Letters",

issn = "0146-9592",

publisher = "Optica Publishing Group",

number = "23",

}

TY - JOUR

T1 - High sensitivity Ge-on-Si single-photon avalanche diode detectors

AU - Llin, Lourdes Ferre

AU - Kirdoda, Jarosław

AU - Thorburn, Fiona

AU - Huddleston, Laura L.

AU - Greener, Zoë M.

AU - Kuzmenko, Kateryna

AU - Vines, Peter

AU - Dumas, Derek C. S.

AU - Millar, Ross W.

AU - Buller, Gerald S.

AU - Paul, Douglas J.

PY - 2020/12/1

Y1 - 2020/12/1

N2 - The performance of planar geometry Ge-on-Si single-photon avalanche diode detectors of 26 µm diameter is presented. Record low dark count rates are observed, remaining less than 100 K counts per second at 6.6% excess bias and 125 K. Single-photon detection efficiencies are found to be up to 29.4%, and are shown to be temperature insensitive. These performance characteristics lead to a significantly reduced noise equivalent power (NEP) of 7.7 × 10−17 WHz− 12 compared to prior planar devices, and represent a two orders of magnitude reduction in NEP compared to previous Ge-on-Si mesa devices of a comparable diameter. Low jitter values of 134 ± 10 ps are demonstrated.

AB - The performance of planar geometry Ge-on-Si single-photon avalanche diode detectors of 26 µm diameter is presented. Record low dark count rates are observed, remaining less than 100 K counts per second at 6.6% excess bias and 125 K. Single-photon detection efficiencies are found to be up to 29.4%, and are shown to be temperature insensitive. These performance characteristics lead to a significantly reduced noise equivalent power (NEP) of 7.7 × 10−17 WHz− 12 compared to prior planar devices, and represent a two orders of magnitude reduction in NEP compared to previous Ge-on-Si mesa devices of a comparable diameter. Low jitter values of 134 ± 10 ps are demonstrated.

UR - http://www.scopus.com/inward/record.url?scp=85097021736&partnerID=8YFLogxK

U2 - 10.1364/OL.396756

DO - 10.1364/OL.396756

M3 - Article

C2 - 33258823

AN - SCOPUS:85097021736

SN - 0146-9592

VL - 45

SP - 6406

EP - 6409

JO - Optics Letters

JF - Optics Letters

IS - 23

ER -

High sensitivity Ge-on-Si single-photon avalanche diode detectors

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this