High-resolution subsurface microscopy of CMOS integrated circuits using radially polarized light

Marius Rutkauskas, Carl Farrell, C. Dorrer, K. L. Marshall, Theodore R Lundquist, Praveen Vedagarbha, Derryck Telford Reid

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)


Under high numerical aperture (NA) conditions, a linearly polarized plane wave focuses to a spot that is extended along the E-field vector, but radially polarized light is predicted to form a circular spot whose diameter equals the narrower dimension obtained with linear polarization. This effect provides an opportunity for improved resolution in high-NA microscopy, and here we present a performance study of subsurface two-photon optical-beam-induced current solid-immersion-lens microscopy of a complementary metal-oxide semiconductor integrated circuit, showing a resolution improvement by using radially polarized illumination. By comparing images of the same structural features we show that radial polarization achieves a resolution of 126 nm, while linear polarization achieves resolutions of 122 and 165 nm, depending on the E-field orientation. These results are consistent with the theoretically expected behavior and are supported by high-resolution images which show superior feature definition using radial polarization.

Original languageEnglish
Pages (from-to)5502-5505
Number of pages4
JournalOptics Letters
Issue number23
Publication statusPublished - 1 Dec 2015


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